RESOURCES

Information on history of APT, working principle and instrumentation can be found from the following resources:

Books on:
Atom Probe Tomography Field Ion Microscopy
  • Gault, B., Moody, M.P., Cairney, J.M., Ringer, S.P. "Atom Probe Microscopy", Springer, 2012.
  • David J. Larson, Ty J. Prosa, Robert M. Ulfig, Brian P. Geiser, Thomas F. Kelly "Local Electrode Atom Probe Tomography: A User's Guide" Springer, 2013.
  • Michael K. Miller, Richard G. Forbes "Atom-Probe Tomography: The Local Electrode Atom Probe" Springer, 2014.
  • "Atom Probe Tomography - Put Theory Into Practice" edited by Williams Lefebvre Francois Vurpillot Xavier Sauvage, Elsevier, 2016.
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  • John J. Hren, S. Ranganathan, "Field-Ion Microscopy", Plenum Press, New York, U.S.A., 1968.
  • Erwin W. Müller, Tien TzouTsong, "Field ion microscopy: principles and applications", American Elsevier Pub. Co., 1969.
  • K. M. Bowkett, David Anthony Smith, "Field-Ion Microscopy", North-Holland Pub. Co., 1970.
  • R. Wagner, "Field-Ion Microscopy", Springer, 1982.
  • Toshio Sakurai, A. Sakai, H. W. Pickering, "Atom-probe field ion microscopy and its applications", Academic Press, 1989.
  • Tien T.Tsong, "Atom-Probe Field Ion Microscopy", Cambridge University Press, 1990.
  • Shu Chiu Lam, "Theoretical Studies on Field-Ion Microscopy", University of Cambridge, 1992.
  • Michael Kenneth Miller, "Atom Probe Field Ion Microscopy", Clarendon Press, 1996.
  • David C. Joy, "Helium Ion Microscopy: Principles and Applications", Springer,2013.
  • Gregor Hlawacek, Armin Gölzhäuser, "Helium Ion Microscopy", Springer International Publications Switzerland, 2016.
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