Review Publications on Atom Probe Tomography

Review Papers on Materials Review Papers on Principles
2018
  1. Kim, R., Bae, C., Ha, Y.-M. and Kim, J., Effect of titanium addition on high temperature workability of high manganese austenitic steel, ISIJ International, 58 (2018) 535-541.
  2. Sato, T., Nanocluster control for achieving high strength aluminum alloys, Materials Transactions, 59 (2018) 861-869.
  3. Zhang, Y., Shinbo, K., Ohmura, T., Suzuki, T., Tsuzaki, K., Miyamoto, G. and Furuhara, T., Randomization of ferrite/austenite orientation relationship and resultant hardness increment by nitrogen addition in vanadium-microalloyed low carbon steels strengthened by interphase precipitation, ISIJ International, 58 (2018) 542-550.
2017
  1. Cook N.J., Ciobanu C.L., Ehrig K., Slattery A., Verdugo-Ihl M.R., Courtney-Davies L. and Gao W., Advances and opportunities in ore mineralogy, Minerals, 7 (2017).
  2. Krauss G., Tempering of Lath Martensite in Low and Medium Carbon Steels: Assessment and Challenges, Steel Research International, 88 (2017).
  3. Lejček P., Šob M. and Paidar V., Interfacial segregation and grain boundary embrittlement: An overview and critical assessment of experimental data and calculated results, Progress in Materials Science, 87 (2017) 83-139.
  4. Li K., Du Y., Zhao P. and Jin Z., Application and Progress of Quantitative Micro- and Nano- Structure Characterization for Materials Design of Al Alloys, Materials China, 36 (2017) 406-413.
  5. Ma Z., Kuhn M. and Johnson D.C., Analytical challenges of determining composition and structure in small volumes with applications to semiconductor technology, nanostructures and solid-state science, Semiconductor Science and Technology, 32 (2017).
  6. Paris O., Lang D., Li J., Schumacher P., Deluca M., Daniel R., Tkadletz M., Schalk N., Mitterer C., Todt J., Keckes J., Zhang Z., Fritz-Popovski G., Ganser C., Teichert C. and Clemens H., Complementary High Spatial Resolution Methods in Materials Science and Engineering, Advanced Engineering Materials, 19 (2017).
  7. Vandervorst W., Fleischmann C., Bogdanowicz J., Franquet A., Celano U., Paredis K., Budrevich A. and Dopant, composition and carrier profiling for 3D structures, Materials Science in Semiconductor Processing, 62 (2017) 31-48.
2016
  1. Klein T., Clemens H. and Mayer S., Advancement of compositional and microstructural design of intermetallic γ-TiAl based alloys determined by atom probe tomography, Materials, 9 (2016).
  2. Liang Z., Yin Z., Yang H., Xiao Y., Hang W. and Li J., Nanoscale surface analysis that combines scanning probe microscopy and mass spectrometry: A critical review, TrAC - Trends in Analytical Chemistry, 75 (2016) 24-34.
  3. Tkadletz M., Schalk N., Daniel R., Keckes J., Czettl C. and Mitterer C., Advanced characterization methods for wear resistant hard coatings: A review on recent progress, Surface and Coatings Technology, 285 (2016) 31-46.
2015
  1. Allen T.R., Kaoumi D., Wharry J.P., Jiao Z., Topbasi C., Kohnert A., Barnard L., Certain A., Field K.G., Was G.S., Morgan D.L., Motta A.T., Wirth B.D. and Yang Y., Characterization of microstructure and property evolution in advanced cladding and duct: Materials exposed to high dose and elevated temperature, Journal of Materials Research, 30 (2015) 1246-1274.
  2. Bhadeshia H.K.D.H., Anomalies in carbon concentration determinations from nanostructured bainite, Materials Science and Technology (United Kingdom), 31 (2015) 758-763.
  3. La Fontaine A., Yen H.-W., Felfer P.J., Ringer S.P. and Cairney J.M., Atom probe study of chromium oxide spinels formed during intergranular corrosion, Scripta Materialia, 99 (2015) 1-4.
  4. Marquis E.A., Atom probe tomography applied to the analysis of irradiated microstructures, Journal of Materials Research, 30 (2015) 1222-1230.
  5. Zelenty J.E., Understanding thermally induced embrittlement in low copper RPV steels utilising atom probe tomography, Materials Science and Technology (United Kingdom), 31 (2015) 981-988.
2014
  1. Takaki S., Akama D., Nakada N. and Tsuchiyama T., Effect of grain boundary segregation of interstitial elements on hallpetch coefficient in steels, Materials Transactions, 55 (2014) 28-34.
2013
  1. Bleuet P., Audoit G., Barnes J.-P., Bertheau J., Dabin Y., Dansas H., Fabbri J.-M., Florin B., Gergaud P., Grenier A., Haberfehlner G., Lay E., Laurencin J., Serra R. and Villanova J., Specifications for hard condensed matter specimens for three-dimensional high-resolution tomographies, Microscopy and Microanalysis, 19 (2013) 726-739.
  2. Chu M.-W. and Chen C.H., Chemical mapping and quantification at the atomic scale by scanning transmission electron microscopy, ACS Nano, 7 (2013) 4700-4707.
  3. Fukuya K., Current understanding of radiation-induced degradation in light water reactor structural materials, Journal of Nuclear Science and Technology, 50 (2013) 213-254.
  4. Holmberg V.C., Helps J.R., Mkhoyan K.A. and Norris D.J., Imaging impurities in semiconductor nanostructures, Chemistry of Materials, 25 (2013) 1332-1350.
  5. Kelly T.F., Miller M.K., Rajan K. and Ringer S.P., Atomic-scale tomography: A 2020 vision, Microscopy and Microanalysis, 19 (2013) 652-664.
2012
  1. de Castro V., Lozano-Perez S., Marquis E.A., Auger M.A., Leguey T. and Pareja R., Analytical characterisation of oxide dispersion strengthened steels for fusion reactors, Energy Materials: Materials Science and Engineering for Energy Systems, 6 (2012) 719-723.
  2. Hono K., Ohkubo T. and Sepehri-Amin H., Microstructure-coercivity relationships of Nd-Fe-B Base permanent magnets, Journal of the Japan Institute of Metals, 76 (2012) 2-11.
  3. Rogozhkin S.V., Aleev A.A., Zaluzhnyi A.G., Kuibida R.P., Kulevoi T.V., Nikitin A.A., Orlov N.N., Chalykh B.B. and Shishmarev V.B., Effect of irradiation by heavy ions on the nanostructure of perspective materials for nuclear power plants, Physics of Metals and Metallography, 113 (2012) 200-211.
  4. Tarui T. and Kubota M., Approaches for fundamental principles 1: Evaluation method of hydrogen embrittlement and improvement techniques of delayed fracture, Nippon Steel Technical Report, 101 (2012) 155-157.
2011
  1. Biasiol G. and Heun S., Compositional mapping of semiconductor quantum dots and rings, Physics Reports, 500 (2011) 117-173.
  2. Robertson I.M., Schuh C.A., Vetrano J.S., Browning N.D., Field D.P., Jensen D.J., Miller M.K., Baker I., Dunand D.C., Dunin-Borkowski R., Kabius B., Kelly T., Lozano-Perez S., Misra A., Rohrer G.S., Rollett A.D., Taheri M.L., Thompson G.B., Uchic M., Wang X.-L. and Was G., Towards an integrated materials characterization toolbox, Journal of Materials Research, 26 (2011) 1341-1383.
  3. Vitek J.M. and Babu S.S., Multiscale characterisation of weldments, Science and Technology of Welding and Joining, 16 (2011) 3-11.
  4. Zinner E.K., Moynier F. and Stroud R.M., Laboratory technology and cosmochemistry, Proceedings of the National Academy of Sciences of the United States of America, 108 (2011) 19135-19141.
2010
  1. Banhart J., Chang C.S.T., Liang Z., Wanderka N., Lay M.D.H. and Hill A.J., Natural aging in Al-Mg-Si alloys - A process of unexpected complexity, Advanced Engineering Materials, 12 (2010) 559-571.
  2. Caballero F.G., Miller M.K. and Garcia-Mateo C., Tracking solute atoms during bainite reaction in a nanocrystalline steel, Materials Science and Technology (United Kingdom), 26 (2010) 889-898.
  3. Schmitz G., Ene C., Galinski H., Schlesiger R. and Stender P., Nanoanalysis of interfacial chemistry, JOM, 62 (2010) 58-63.
  4. Srinivasan R., Banerjee R., Viswanathan G.B., Nag S., Hwang J.Y., Tiley J. and Fraser H.L., The use of advanced characterization to study transitions across solid state interfaces, JOM, 62 (2010) 64-69.
  5. Tolstoguzov A.B., Atom probe mass spectrometry, Journal of Analytical Chemistry, 65 (2010) 1311-1319.
2007
  1. Seidman D.N., Perspective: From field-ion microscopy of single atoms to atom-probe tomography: A journey: "Atom-probe tomography" [Rev. Sci. Instrum. 78, 031101 (2007)], Review of Scientific Instruments, 78 (2007).
2006
  1. Thompson K., Larson D.J., Ulfig R.M., Bunton J.H. and Kelly T.F., Analyzing Si-based structures in 3D with a laser-pulsed local electrode atom probe, Solid State Technology, 49 (2006) 65-72.
2005
  1. Fisher R., Probing mind, Engineer, 293 (2005) 32-33.
  2. Maruyama N. and Smith G.D.W., 3DAP analysis on solute segregation of Nb and Mo during primary recrystallization of a-Fe, Nippon Steel Technical Report, 91 (2005) 34-37.
  3. Nishikwa O. and Taniguchi M., Atom-by-atom analysis of non-metallic materials by the scanning atom probe, Chinese Journal of Physics, 43 (2005) 111-123.
  4. Petford-Long A.K., Ma Y.Q., Cerezo A., Larson D.J., Singleton E.W. and Karr B.W., The formation mechanism of aluminum oxide tunnel barriers: Three-dimensional atom probe analysis, Journal of Applied Physics, 98 (2005).
  5. Takahash J., Kawasaki K., Kawakami K. and Sugiyama M., Three-dimensional atom probe analysis of nitriding steel containing Cr and Cu, Nippon Steel Technical Report, 91 (2005) 23-27.
  6. Takahashi J., Sugiyama M. and Maruyama N., Quantitative observation of grain boundary carbon segregation in bake-hardening steels, Nippon Steel Technical Report, 91 (2005) 28-33.
2004
  1. Adachi T., Analysis of Cu silicides by atom-probe field ion microscope, Shinku/Journal of the Vacuum Society of Japan, 47 (2004) 568-573.
  2. Babu S.S., David S.A., Park J.W. and Vitek J.M., Joining of nickel base superalloy single crystals, Science and Technology of Welding and Joining, 9 (2004) 1-12.
  3. Bagot P.A.J., Fundamental surface science studies of automobile exhaust catalysis, Materials Science and Technology, 20 (2004) 679-694.
  4. Larson D.J., Petford-Long A.K., Ma Y.Q. and Cerezo A., Information storage materials: Nanoscale characterisation by three-dimensional atom probe analysis, Acta Materialia, 52 (2004) 2847-2862.
  5. Tripathi S., Gribb T.T., Kelly T.F. and Ulfig R., Using an atom probe microscope to characterize read heads, Solid State Technology, 47 (2004) S6-S8.
2003
  1. Sinnott S.B. and Dickey E.C., Ceramic/metal interface structures and their relationship to atomic- and meso-scale properties, Materials Science and Engineering R: Reports, 43 (2003) 1-60.
2002
  1. Seidman D.N., Subnanoscale studies of segregation at grain boundaries: Simulations and experiments, Annual Review of Materials Science, 32 (2002) 235-269.
1998
  1. Howe J.M., Atomic structure, composition, mechanisms and dynamics of transformation interfaces in diffusional phase transformations, Materials Transactions, JIM, 39 (1998) 3-23.
1996
  1. Nishikawa O., Iwatsuki M., Aoki S. and Ishikawa Y., Performance of the trial scanning atom probe: New approach to evaluate the microtip apex, Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, 14 (1996) 2110-2113.
1995
  1. Sofield C.J. and Stoneham A.M., Oxidation of silicon: The VLSI gate dielectric, Semiconductor Science and Technology, 10 (1995) 215-244.
1991
  1. Nishikawa O., Tomitori M. and Iwawaki F., Atomic configurations of tip apexes and scanning tunnelling microscopy-spectroscopy, Materials Science and Engineering B, 8 (1991) 81-97.
1988
  1. Tsong T.T., Experimental studies of the behaviour of single adsorbed atoms on solid surfaces, Reports on Progress in Physics, 51 (1988) 759-832.
 2017
  1. Kelly T.F., Atomic-scale analytical tomography, Microscopy and Microanalysis, 23 (2017) 34-45.
2014
  1. Kelly T.F., Vella A., Bunton J.H., Houard J., Silaeva E.P., Bogdanowicz J. and Vandervorst W., Laser pulsing of field evaporation in atom probe tomography, Current Opinion in Solid State and Materials Science, 18 (2014) 81-89.
2013
  1. Shimizu Y., Inoue K., Takamizawa H., Yano F. and Nagai Y., Elemental distribution analysis of semiconductor nanostructures with atom probe tomography, Journal of the Vacuum Society of Japan, 56 (2013) 340-347.
2012
  1. Gault B., Moody M.P., Cairney J.M. and Ringer S.P., Atom probe crystallography, Materials Today, 15 (2012) 378-386.
  2. Kelly T.F. and Larson D.J., Atom probe tomography 2012, Annual Review of Materials Research, 42 (2012) 1-31.
  3. Miller M.K., Kelly T.F., Rajan K. and Ringer S.P., The future of atom probe tomography, Materials Today, 15 (2012) 158-165.
2011
  1. Kelly T.F., Kinetic-energy discrimination for atom probe tomography, Microscopy and Microanalysis, 17 (2011) 1-14.
2007
  1. Cerezo A., Clifton P.H., Galtrey M.J., Humphreys C.J., Kelly T.F., Larson D.J., Lozano-Perez S., Marquis E.A., Oliver R.A., Sha G., Thompson K., Zandbergen M. and Alvis R.L., Atom probe tomography today, Materials Today, 10 (2007) 36-42.
  2. Kelly T.E., Larson D.J., Thompson K., Alvis R.L., Bunton J.H., Olson J.D. and Gorman B.R., Atom probe tomography of electronic materials, Annual Review of Materials Research, 37 (2007) 681-727.
  3. Kelly T.F. and Miller M.K., Invited review article: Atom probe tomography, Review of Scientific Instruments, 78 (2007).
  4. Seidman D.N., Three-dimensional atom-probe tomography: Advances and applications, Annual Review of Materials Research, 37 (2007) 127-158.
2005
  1. Blavette D., Pareige C., Cadel E., Auger P. and Deconihout B., A journey in the atomic-scale microstructure of materials using atom-probe tomography, Chinese Journal of Physics, 43 (2005) 132-144.
2003
  1. Cadel E., Fraczkiewicz A. and Blavette D., Atomic Scale Investigation of Impurity Segregation to Crystal Defects, Annual Review of Materials Research, 33 (2003) 215-231.
2002
  1. Hono K., Nanoscale microstructural analysis of metallic materials by atom probe field ion microscopy, Progress in Materials Science, 47 (2002) 621-729.
2000
  1. Cerezo A., Godfrey T.J., Huang M. and Smith G.D.W., Design of a scanning atom probe with improved mass resolution, Review of Scientific Instruments, 71 (2000) 3016-3023.
1997
  1. Hono K. and Sakurai T., Recent atom probe studies at IMR - A comprehensive review, Science Reports of the Research Institutes Tohoku University Series A-Physics, 44 (1997) 223-240.
  2. Miller M.K., Three-dimensional atom probes, Journal of Microscopy, 186 (1997) 1-16.
1989
  1. Tsong T.T., Chen C.-L. and Liu J., Atom-probe field ion microscope analysis of surfaces of materials, Journal of Materials Research, 4 (1989) 1549-1559.
1987
  1. Kellog G.L., Pulsed-laser atom probe mass spectroscopy, Journal of Physics E: Scientific Instruments, 20 (1987) 125-136.
1978
  1. Panitz J.A., Imaging atom-probe mass spectroscopy, Progress in Surface Science, 8 (1978) 219-262.